Seminar in Chip Test and Debug
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Course Description
Seminars by industry professionals in digital IC manufacturing test and silicon debug. Topics include yield and binsplit modeling, defect types and detection, debug hardware, physical analysis, and design for test/debug circuits. Case studies of silicon failures. Prerequisite: basic digital IC design (271 or 371).
Grading Basis
RSN - Satisfactory/No Credit
Min
1
Max
1
Course Repeatable for Degree Credit?
No
Course Component
Seminar
Enrollment Optional?
No