Nanocharacterization of Materials
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Course Description
Current methods of directly examining the microstructure of materials. Topics: optical microscopy, scanning electron and focused ion beam microscopy, field ion microscopy, transmission electron microscopy, scanning probe microscopy, and microanalytical surface science methods. Emphasis is on the electron-optical techniques. Recommended: 193/203.
Grading Basis
ROP - Letter or Credit/No Credit
Min
3
Max
3
Course Repeatable for Degree Credit?
No
Course Component
Lecture
Enrollment Optional?
No
Does this course satisfy the University Language Requirement?
No
Programs
MATSCI320
is a
completion requirement
for: